Bayesian Approach for Constant-Stress Accelerated Life Testing for Kumaraswamy Weibull Distribution with Censoring

Abstract

The accelerated life tests provide quick information on the life time distributions by testing materials or products at higher than basic conditional levels of stress such as pressure, high temperature, vibration, voltage or load to induce failures. In this paper, the acceleration model assumed is log linear model. Constant stress tests are discussed based on Type I and Type II censoring. The Kumaraswmay Weibull distribution is used. The estimators of the parameters, reliability, hazard rate functions and p-th percentile at normal condition, low stress, and high stress are obtained. In addition, credible intervals for parameters of the models are constructed. Optimum test plan are designed. Some numerical studies are used to solve the complicated integrals such as Laplace and Markov Chain Monte Carlo methods.